Brozek, Tomasz: search on Z-Library

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1

Plasma damage in thin gate MOS dielectrics and its effect on device characteristics and reliability

Tomasz Brożek, John Huber, James Walls

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 406 KB

english, 2000

2

Boron penetration effect on gate oxide reliability of 50 Å PMOS devices

Carl Kyono, Tomasz Brożek, Vida Ilderem

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 210 KB

english, 2000

3

Gate oxide leakage due to temperature accelerated degradation under plasma charging conditions

Tomasz Brożek, Y.David Chan, Chand R Viswanathan

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 286 KB

english, 1998

4

Contact Chains for FinFET Technology Characterization

Brozek, Tomasz, Lam, Stephen, Yu, Shia, Pak, Mike K., Liu, Tom, Vallishayee, Rakesh, Yokoyama, Nobuharu

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2015

Language:

english

File:

PDF, 1.39 MB

english, 2015

5

Series resistance degradation due to NBTI in PMOSFET

Mahesh S. Krishnan, Viktor Kol’dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li

Journal:

Microelectronics Reliability

Year:

2002

File:

PDF, 737 KB

2002

6

Dielectric integrity of thin thermal oxides on silicon

Tomasz Brożek, Andrzej Jakubowski

Journal:

Microelectronics Reliability

Year:

1993

Language:

english

File:

PDF, 1.12 MB

english, 1993

7

Investigation of plasma damage effects on characteristics and reliability of MOS devices with thin gate dielectrics

Tomasz Brozek, John Huber, James Walls

Journal:

Solid-State Electronics

Year:

2001

Language:

english

File:

PDF, 338 KB

english, 2001

8

Physiotherapy in Asthma—Seeking Consensus

Nowobilski, Roman, Plaszewski, Maciej, Wloch, Tomasz, Mika, Piotr, Gajewski, Piotr, Brożek, Jan L.

Journal:

Journal of Asthma

Year:

2013

Language:

english

File:

PDF, 151 KB

english, 2013

9

Effect of radiation on breakdown of electrically pre-degraded oxides in MOS structures

Tomasz Brożek, Robert Wiśniewski, Romuald B. Beck, Andrzej Jakubowski

Journal:

Microelectronic Engineering

Year:

1995

Language:

english

File:

PDF, 322 KB

english, 1995

10

Effect of boron on gate oxide degradation and reliability in PMOS devices

Tomasz Brozek, Carl Kyono, Vida Ilderem

Journal:

Solid-State Electronics

Year:

2001

Language:

english

File:

PDF, 181 KB

english, 2001

11

Editorial

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 208 KB

english, 2005

12

Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories

Brozek, Tomasz, Ciplickas, Dennis

Journal:

IEEE Journal of the Electron Devices Society

Year:

2019

Language:

english

File:

PDF, 1.30 MB

english, 2019

13

Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories

Brozek, Tomasz, Ciplickas, Dennis

Journal:

IEEE Journal of the Electron Devices Society

Year:

2019

File:

PDF, 1.30 MB

2019

14

Charge build-up and oxide wear-out during Fowler-Nordheim electron injection in irradiated MOS structures

Tomasz Brożek, Andrzej Jakubowski

Journal:

Microelectronics Journal

Year:

1994

Language:

english

File:

PDF, 583 KB

english, 1994

15

SPIE Proceedings [SPIE International Conference on Microelectronics - Warsaw, Poland (Monday 21 September 1992)] International Conference of Microelectronics: Microelectronics '92 - Influence of silicon surface carbon contamination on oxide quality and SiO2-Si systems properties

Beck, Romuald B., Brozek, Tomasz, Ruzyllo, Jerzy, Sowinski, Andrzej, Grzybowski, Jan, Kucharski, Witold T., Romaniuk, Ryszard S.

Year:

1992

Language:

english

File:

PDF, 342 KB

english, 1992

16

Oxide thickness dependence of hole trap generation in MOS structures under high-field electron injection

Tomasz Brożek, Eric B. Lum, Chand R. Viswanathan

Journal:

Microelectronic Engineering

Year:

1997

Language:

english

File:

PDF, 291 KB

english, 1997

17

[IEEE 2014 International Conference on Microelectronic Test Structures (ICMTS) - Udine, Italy (2014.3.24-2014.3.27)] 2014 International Conference on Microelectronic Test Structures (ICMTS) - Gated contact chains for process characterization in FinFET technologies

Brozek, Tomasz, Lam, Stephen, Yu, Shia, Pak, Mike, Liu, Tom, Valishayee, Rakesh, Yokoyama, Nobuharu

Year:

2014

Language:

english

File:

PDF, 1.28 MB

english, 2014

18

Increased hole trapping in gate oxides as latent damage from plasma charging

Brozek, Tomasz, Viswanathan, Chand R

Journal:

Semiconductor Science and Technology

Year:

1997

Language:

english

File:

PDF, 221 KB

english, 1997

19

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Monday 18 September 2000)] Process Control and Diagnostics - Sensitivity of polysilicon and polycide antenna MOS capacitor to ion implantation charging effects

Brozek, Tomasz, Norton, Cory, Miller, Michael L., Ashtiani, Kaihan A.

Year:

2000

Language:

english

File:

PDF, 247 KB

english, 2000

20

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing - In-line testing of antenna-type test structures for separation of sources of process-induced damage

Brozek, Tomasz, Roberts, Douglas, Dao, Thuy, DeBusk, Damon K., Ajuria, Sergio A.

Year:

1997

Language:

english

File:

PDF, 524 KB

english, 1997

21

[IEEE 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - Kita-Kyushu City, Fukuoka, Japan (2019.3.18-2019.3.21)] 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) - Evaluation of Truly Passive Crossbar Memory Arrays on Short Flow Characterization Vehicle Test Chips

Hess, Christopher, Brozek, Tomasz, Schneider, Hendrik, Yu, Yuan, Lunenborg, Meindert, Ng, Khim Hong, Ciplickas, Dennis, Vallishayee, Rakesh, Dolainsky, Christoph, Weiland, Larg H.

Year:

2019

File:

PDF, 1.14 MB

2019

22

[IEEE 2019 Electron Devices Technology and Manufacturing Conference (EDTM) - Singapore, Singapore (2019.3.12-2019.3.15)] 2019 Electron Devices Technology and Manufacturing Conference (EDTM) - Cross Point Test Arrays for Development and Yield Ramp of Emerging Memories

Brozek, Tomasz, Ciplickas, Dennis

Year:

2019

Language:

english

File:

PDF, 278 KB

english, 2019

23

SPIE Proceedings [SPIE International Conference on Microelectronics - Warsaw, Poland (Monday 21 September 1992)] International Conference of Microelectronics: Microelectronics '92 - Radiation hardness of silicon dioxide dielectric strength in silicon MOS structures

Brozek, Tomasz, Sowinski, Andrzej, Grzybowski, Jan, Kucharski, Witold T., Romaniuk, Ryszard S.

Year:

1992

Language:

english

File:

PDF, 451 KB

english, 1992

24

Hereditary ovarian cancer in Poland

Janusz Menkiszak, Jacek Gronwald, Bohdan Górski, Anna Jakubowska, Tomasz Huzarski, Tomasz Byrski, Małgorzata Foszczyńska-Kłoda, Olga Haus, Hanna Janiszewska, Magdalena Perkowska, Izabela Brożek, Ewa G

Journal:

International Journal of Cancer

Year:

2003

Language:

english

File:

PDF, 81 KB

english, 2003

25

Prevalence and clinical correlations of BRCA1/BRCA2 unclassified variant carriers among unselected primary ovarian cancer cases – preliminary report

Ewa J. Majdak, Geertruida H. De Bock, Izabela Brozek, Magdalena Perkowska, Karolina Ochman, Jaroslaw Debniak, Tomasz Milczek, Cees J. Cornelisse, J. Jassem, Janusz Emerich, Janusz Limon, Peter Devilee

Journal:

European Journal of Cancer

Year:

2005

Language:

english

File:

PDF, 119 KB

english, 2005

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